Senior AFM Applications Scientist (UK) – Semiconductor Metrology
Infinitesima
| Company | Infinitesima |
| Category | Science & Research |
| Location | Abingdon |
| Remote | On-site (inferred) |
| Employment | Not stated |
| Level | Senior |
| Salary | Not stated by the employer |
| Posted | 9 Jun 2026 |
| Last verified | 9 Aug 2026 |
| Source | Employer ATS (greenhouse) |
Description
Senior AFM Applications Scientist – Semiconductor Metrology
£65,000 – £75,000 + EMI Share Options + Private Healthcare + Pension
Are you an experienced Atomic Force Microscopy (AFM) specialist looking to influence the future of semiconductor metrology?
We're looking for a Senior AFM Applications Scientist to act as the critical link between customers, engineering and product development, helping shape how our technology performs in advanced semiconductor manufacturing environments around the world.
This is a highly visible role combining customer engagement, scientific problem-solving, product development and advanced characterisation. You'll work directly with leading semiconductor customers, helping solve complex measurement challenges while influencing the next generation of AFM-based metrology solutions.
If you're passionate about AFM and want to see your expertise directly impact both customer success and product innovation, we'd love to hear from you.
What you'll be doing
Leading customer demonstrations, evaluations and characterisation programmes
Acting as the technical authority for AFM applications and semiconductor metrology challenges
Presenting technical findings and performance data to customers and internal stakeholders
Supporting global customers with complex application and measurement challenges
Troubleshooting multidisciplinary issues involving optics, software, electronics, algorithms and mechanical systems
Driving application-focused development projects that improve product performance and customer outcomes
Acting as the voice of the customer, translating market needs into future product enhancements
Working alongside Engineering and R&D teams to influence product roadmap decisions
Supporting and developing world-class applications laboratory capability
Travelling internationally (approximately 50%) to support customer sites, evaluations and strategic projects
We're particularly interested in people with experience in:
Atomic Force Microscopy (AFM)
Semiconductor Metrology
Semiconductor Process Control
Semiconductor Process Characterisation
Advanced Surface Analysis
Nanoscale Measurement
Scanning Probe Microscopy (SPM)
Semiconductor Inspection Systems
Defect Analysis and Yield Improvement
Essential experience
Minimum 5 years of hands-on Atomic Force Microscopy (AFM) experience
Semiconductor industry experience with strong practical application knowledge
Leading customer-facing technical projects, demonstrations or evaluations
Supporting advanced metrology or scientific instrumentation systems
Characterisation of complex materials, structures or semiconductor devices
Diagnosing and resolving multidisciplinary technical issues
Strong presentation and stakeholder communication skills
Ability to translate customer requirements into actionable development opportunities
Experience working across engineering, scientific and commercial teams
Nice to have
Semiconductor process development experience
Scanning Electron Microscopy (SEM)
Optical systems, lasers or fibre-optic technologies
Electronics or precision electromechanical systems
Product marketing, technical positioning or customer storytelling
Experience influencing product roadmaps through customer insight
Cleanroom or semiconductor fabrication environments
Qualifications
Master's degree, PhD or equivalent experience in Physics, Materials Science, Engineering, Nanotechnology or a related scientific discipline
or
Significant commercial experience gained within AFM, semiconductor metrology or advanced scientific instrumentation environments
Why join Infinitesima?
Infinitesima develops advanced Atomic Force Microscopy technology designed specifically for semiconductor manufacturing applications.
As semiconductor devices continue to scale in complexity, accurate nanoscale measurement becomes increasingly critical. Ou